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Test-Retest Reliability Analysis of Resting-state EEG Measures and Their Association with Long-Term Memory in Children and Adults
Ziogas, Anastasios
Ruch, Simon
ORCID
UniDistance Suisse
Skieresz, Nicole H.
Marca, Sandy C.
Rothen, Nicolas
Reber, Thomas P.
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06.08.2025
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DOI
10.1101/2025.08.04.668389
URI
https://pub.orcid.org/v3.0/0000-0002-5796-4543/work/189360080
ARK
ark:/51647/srd1335987
Persistent URL
https://n2t.net/ark:/51647/srd1335987
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